The study of lifetime distribution and reliability testing seeks to characterise the statistical behaviour of time-to-failure data for components and systems across a range of applications, from ...
This post is by Stuart Brown, Environmental Managing Director at TRaC. This post is by Stuart Brown, Environmental Managing Director at TRaC. Many people see reliability testing as a black art.
As technology shrinks, Yield and Reliability (YAR) are major challenges of SoC (System on Chip) production. There are many techniques available for increasing YAR. YAR of devices depend on testing ...
Undaunted by the skyrocketing costs of new semiconductor fabs and the formidable hurdles facing the industry with each new technology node, leading IC manufacturers are continuing to strive for ...
We’ve all experienced the effect of electrostatic discharge at some point in our lives, the most common case being a tingling sensation one feels after touching a door knob or any metal surface. When ...
iNEMI (International Electronics Manufacturing Initiative) has begun driving two collaborative efforts that will focus on reliability and testing issues for MEMS technologies. Using information ...
Congratulations to alumnus Bryan Root (ElEngr’84), who was recently elevated to Institute of Electrical and Electronics Engineers Fellow for leadership in improving semiconductor reliability test ...
The authors describe a novel approach for assessing method robustness. This article contains online-bonus material and was copublished with Pharmaceutical Technology Europe.
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